ATPG for Faults Analysis in VLSI Circuits Using Immune Genetic Algorithm
نویسندگان
چکیده
منابع مشابه
ATPG for Faults Analysis in VLSI Circuits Using Immune Genetic Algorithm
As design trends move toward nanometer technology, new Automatic Test Pattern Generation (ATPG)problems are merging. During design validation, the effect of crosstalk on reliability and performance cannot be ignored. So new ATPG Techniques has to be developed for testing crosstalk faults which affect the timing behaviour of circuits. In this paper, we present a Genetic Algorithm (GA) based test...
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ژورنال
عنوان ژورنال: International Journal of Computer and Communication Technology
سال: 2012
ISSN: 2231-0371,0975-7449
DOI: 10.47893/ijcct.2012.1152